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[키워드: "Kwan-Yong Lim"]

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  • 자료유형
    • Conference Materials(17)
    • Academic Journals(9)
    • Magazines(1)

  • 주제어
    • components, circuits, devices and systems(9)
    • engineered materials, dielectrics and plasmas(9)
    • random access memory(8)
    • oxidation(6)
    • degradation(5)
    • hydrogen(4)
    • leakage current(4)
    • mos capacitors(4)
    • atomic layer deposition(3)
    • chemical vapor deposition(3)
    • dram(3)
    • electrodes(3)
    • general topics for engineers(3)
    • transistors(3)
    • tungsten(3)
    • 1t-dram(2)
    • annealing(2)
    • boron(2)
    • capacitance-voltage characteristics(2)
    • capacitorless dram(2)
    • crystals(2)
    • current measurement(2)
    • dielectrics(2)
    • embedded memory(2)
    • epitaxy(2)
    • hot carriers(2)
    • mosfet circuits(2)
    • plasma(2)
    • plasma properties(2)
    • roentgenium(2)
    • semiconductor films(2)
    • silicon(2)
    • silicon-on-insulator (soi) mosfets(2)
    • stress(2)
    • stress measurement(2)
    • threshold voltage(2)
    • tin(2)
    • transmission electron microscopy(2)
    • aluminum oxide(1)
    • atherosclerosis(1)
    • atomic layer deposition (ald)(1)
    • capacitance(1)
    • capacitance measurement(1)
    • capacitors(1)
    • charge carrier processes(1)
    • charge exchange(1)
    • circuits(1)
    • cmos process(1)
    • computed tomography(1)
    • computing and processing(1)

  • 저널
    • ieee electron device letters, electron device letters, ieee, ieee electron device lett.(4)
    • ieee electron device letters(2)
    • journal of applied physics(2)
    • 2001 symposium on vlsi technology. digest of technical papers (ieee cat. no.01 ch37184)(1)
    • 2001 symposium on vlsi technology. digest of technical papers (ieee cat. no.01 ch37184), vlsi technology, 2001. digest of technical papers. 2001 symposium on, vlsi technology(1)
    • 2004 ieee international reliability physics symposium. proceedings, reliability physics symposium proceedings, 2004. 42nd annual. 2004 ieee international, reliability physics(1)
    • 2006 european solid-state device research conference(1)
    • 2006 european solid-state device research conference, solid-state device research conference, 2006. essderc 2006. proceeding of the 36th european(1)
    • 2006 ieee international reliability physics symposium proceedings(1)
    • 2006 ieee international reliability physics symposium proceedings, reliability physics symposium proceedings, 2006. 44th annual., ieee international(1)
    • 2006 symposium on vlsi technology, 2006. digest of technical papers.(1)
    • 2007 ieee international reliability physics symposium proceedings 45th annual(1)
    • 2007 ieee international reliability physics symposium proceedings. 45th annual, reliability physics symposium, 2007. proceedings. 45th annual. ieee international(1)
    • 2010 international electron devices meeting, electron devices meeting (iedm), 2010 ieee international(1)
    • applied science and convergence technology(1)
    • essderc 2007 - 37th european solid state device research conference(1)
    • essderc 2007 - 37th european solid state device research conference, solid state device research conference, 2007. essderc 2007. 37th european(1)
    • international electron devices meeting. technical digest (cat. no.01ch37224), electron devices meeting, 2001. iedm '01. technical digest. international, electron devices meeting 2001(1)
    • proceedings of the 2004 ieee international reliability physics symposium(1)
    • proceedings of the 30th european solid-state circuits conference (ieee cat. no.04ex850)(1)
    • proceedings of the 30th european solid-state circuits conference (ieee cat. no.04ex850), solid-state device research conference, 2004. essderc 2004. proceeding of the 34th european, solid-state device research conference(1)
    • surface and interface analysis(1)

  • 발행처
    • ieee(22)
    • american institute of physics(2)
    • 한국진공학회(asct)(1)

  • 언어
    • english(26)
    • korean(1)

  • 수록DB
    • IEEE Xplore Digital Library(13)
    • Complementary Index(11)
    • Academic Search Complete(1)
    • DBPIA(1)
    • Supplemental Index(1)
    • USPTO Patent Applications(1)

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