서강대학교 로욜라도서관

탑메뉴

전체메뉴

전체메뉴닫기


검색

학술논문(Articles)검색

상세검색
검색어
[키워드: "Makris, Yiorgos"]

검색결과제한

  • Facet Limit
    • 원문(Full Text)
    • Peer-Reviewed 학술지
    • -

    재검색

  • 자료유형
    • Academic Journals(122)
    • Conference Materials(101)
    • Reviews(9)
    • Magazines(2)
    • Reports(2)
    • Books(2)

  • 주제어
    • components, circuits, devices and systems(30)
    • computing and processing(23)
    • microprocessors(20)
    • concurrent error detection(19)
    • integrated circuits(19)
    • hardware(15)
    • circuits(13)
    • integrated circuit modeling(13)
    • training(13)
    • computer architecture(12)
    • machine learning(12)
    • semiconductor device modeling(12)
    • radio frequency(11)
    • testing(11)
    • algorithms(10)
    • communication, networking and broadcast technologies(10)
    • computational modeling(10)
    • reliability(10)
    • circuit faults(9)
    • design(9)
    • fault location (engineering)(9)
    • transient analysis(9)
    • control logic(8)
    • hardware design languages(8)
    • logic gates(8)
    • methodology(8)
    • semiconductor device measurement(8)
    • accuracy(7)
    • analog circuits(7)
    • analog electronic systems(7)
    • analytical models(7)
    • biological neural networks(7)
    • clocks(7)
    • computer input-output equipment(7)
    • cost effectiveness(7)
    • kernel(7)
    • performance evaluation(7)
    • predictive models(7)
    • registers(7)
    • algebra(6)
    • analog test(6)
    • avf(6)
    • circuit testing(6)
    • computer engineering(6)
    • data analysis(6)
    • demodulation(6)
    • electronic circuits(6)
    • latches(6)
    • logic(6)
    • microelectronics(6)

  • 저널
    • ieee transactions on computers(32)
    • ieee transactions on computer-aided design of integrated circuits & systems(21)
    • ieee transactions on very large scale integration (vlsi) systems(8)
    • institute of electrical and electronics engineers. transactions on computers(8)
    • proceedings of the conference: design, automation & test in europe(8)
    • ieee design & test of computers(7)
    • ieee transactions on reliability(7)
    • ieee transactions on computer-aided design of integrated circuits and systems(5)
    • international conference on computer aided design(5)
    • conference on design, automation & test in europe(4)
    • great lakes symposium on vlsi(4)
    • ieee transactions on information forensics and security(4)
    • journal of electronic testing(4)
    • ieee design & test(3)
    • ieee transactions on instrumentation & measurement(3)
    • ieee transactions on neural networks & learning systems(3)
    • ieee transactions on neural networks and learning systems(3)
    • 2012 ieee 30th vlsi test symposium (vts)(2)
    • 2012 ieee/acm international conference on computer-aided design (iccad)(2)
    • 2013 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2013(2)
    • 2013 ieee 19th international on-line testing symposium (iolts)(2)
    • 2013 ieee international test conference (itc), test conference (itc), 2013 ieee international(2)
    • 2017 ieee 35th vlsi test symposium (vts), vlsi test symposium (vts), 2017 ieee 35th(2)
    • 2018 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2018(2)
    • 2019 ieee 25th international symposium on on-line testing and robust system design (iolts), on-line testing and robust system design (iolts ), 2019 ieee 25th international symposium on(2)
    • 2019 ieee 37th vlsi test symposium (vts), vlsi test symposium (vts), 2019 ieee 37th(2)
    • 2019 ieee international test conference (itc), test conference (itc), 2019 ieee international(2)
    • 2020 design, automation & test in europe conference & exhibition (date)(2)
    • microelectronics journal(2)
    • proceedings of the ieee(2)
    • 2009 27th ieee vlsi test symposium, vlsi test symposium, 2009. vts '09. 27th ieee(1)
    • 2012 ieee/acm international conference on computer-aided design (iccad), computer-aided design (iccad), 2012 ieee/acm international conference on(1)
    • 2013 18th ieee european test symposium (ets), test symposium (ets), 2013 18th ieee european(1)
    • 2013 ieee 31st vlsi test symposium (vts), vlsi test symposium (vts), 2013 ieee 31st(1)
    • 2016 ieee 34th international conference on computer design (iccd), computer design (iccd), 2016 ieee 34th international conference on(1)
    • 2016 ieee international symposium on hardware oriented security and trust (host), hardware oriented security and trust (host), 2016 ieee international symposium on(1)
    • 2016 ieee international test conference (itc), test conference (itc), 2016 ieee international(1)
    • 2016 ieee/acm international conference on computer-aided design (iccad), computer-aided design (iccad), 2016 ieee/acm international conference on(1)
    • 2017 ieee international symposium on circuits and systems (iscas), circuits and systems (iscas), 2017 ieee international symposium on(1)
    • 2018 28th international symposium on power and timing modeling, optimization and simulation (patmos), power and timing modeling, optimization and simulation (patmos), 2018 28th international symposium on(1)
    • 2018 ieee 36th vlsi test symposium (vts), vlsi test symposium (vts), 2018 ieee 36th(1)
    • 2019 16th international conference on synthesis, modeling, analysis and simulation methods and applications to circuit design (smacd), synthesis, modeling, analysis and simulation methods and applications to circuit design (smacd), 2019 16th international conference on(1)
    • 2019 20th international workshop on microprocessor/soc test, security and verification (mtv), microprocessor/soc test, security and verification (mtv), 2019 20th international workshop on(1)
    • 2019 ieee 37th international conference on computer design (iccd), computer design (iccd), 2019 ieee 37th international conference on(1)
    • 2019 ieee/acm international conference on computer-aided design (iccad), computer-aided design (iccad), 2019 ieee/acm international conference on(1)
    • 2019 international conference on field-programmable technology (icfpt), field-programmable technology (icfpt), 2019 international conference on, icfpt(1)
    • 2020 ieee 38th vlsi test symposium (vts), vlsi test symposium (vts), 2020 ieee 38th(1)
    • ieee transactions on computers, computers, ieee transactions on, ieee trans. comput.(1)
    • integration(1)
    • integration, the vlsi journal(1)

  • 발행처
    • ieee(134)
    • association for computing machinery(33)
    • ieee-inst electrical electronics engineers inc(19)
    • ieee computer soc(11)
    • springer nature(6)
    • elsevier b.v.(5)
    • edaa(4)
    • hal ccsd(2)
    • springer(2)
    • academic publication council(1)
    • acm(1)
    • elsevier(1)
    • elsevier ltd(1)
    • elsevier science bv(1)
    • institute of electrical and electronics engineeers(1)

  • 언어
    • english(231)

  • 수록DB
    • Complementary Index(105)
    • Science Citation Index(35)
    • IEEE Xplore Digital Library(34)
    • Academic Search Complete(23)
    • Business Source Complete(19)
    • MathSciNet via EBSCOhost(9)
    • ScienceDirect(3)
    • OpenAIRE(2)
    • MEDLINE(1)
    • arXiv(1)

232

1 - 10 다음페이지로

내보내기

내보내기
내보내기 형식을 선택하세요.

o RefWorks에서 이용 가능한 형식으로 반출합니다.

o EndNote에서 이용 가능한 형식으로 반출합니다.

※ 중복 레코드가 제거된 검색 결과가 표시됩니다.