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[키워드: "Rei-Fu Huang"]

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  • Facet Limit
    • 원문(Full Text)
    • Peer-Reviewed 학술지
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  • 자료유형
    • Conference Materials(40)
    • Academic Journals(11)

  • 주제어
    • random access memory(16)
    • circuit faults(15)
    • components, circuits, devices and systems(15)
    • circuit testing(14)
    • built-in self-test(12)
    • computing and processing(11)
    • algorithm design and analysis(10)
    • redundancy(7)
    • signal processing and analysis(7)
    • costs(6)
    • power, energy and industry applications(6)
    • system-on-a-chip(6)
    • automatic testing(5)
    • circuit simulation(5)
    • computer storage devices(5)
    • memory testing(4)
    • read-write memory(4)
    • system testing(4)
    • testing(4)
    • built-in self-repair (bisr)(3)
    • communication, networking and broadcast technologies(3)
    • electrical fault detection(3)
    • fault detection(3)
    • fault diagnosis(3)
    • hardware(3)
    • integrated circuit testing(3)
    • resistance(3)
    • semiconductors(3)
    • sram chips(3)
    • stress(3)
    • analytical models(2)
    • built-in self-test (bist)(2)
    • computational modeling(2)
    • dynamic random access memory(2)
    • electronic equipment testing(2)
    • embedded computer systems(2)
    • embedded dram(2)
    • error correction codes(2)
    • fault model(2)
    • flash memory(2)
    • geometry(2)
    • mathematical model(2)
    • microelectronics(2)
    • mim capacitors(2)
    • mosfets(2)
    • optoelectronics(2)
    • production(2)
    • retention(2)
    • semiconductor device testing(2)
    • semiconductor memory(2)

  • 저널
    • ieee transactions on very large scale integration (vlsi) systems, very large scale integration (vlsi) systems, ieee transactions on, ieee trans. vlsi syst.(3)
    • 13th asian test symposium(2)
    • 13th asian test symposium, test symposium, 2004. 13th asian, asian test symposium(2)
    • 2003 test symposium, test symposium, 2003. ats 2003. 12th asian, twelfth asian symposium(2)
    • applied physics letters(2)
    • dac: annual acm/ieee design automation conference(2)
    • ieee design & test of computers(2)
    • ieee transactions on very large scale integration (vlsi) systems(2)
    • test symposium, 2003. ats 2003. 12th asian(2)
    • 2004 international conferce on test, test conference, 2004. proceedings. itc 2004. international, international test conference(1)
    • 2004 international conference on test(1)
    • 2005 ieee vlsi-tsa international symposium on vlsi design, automation & test, 2005. (vlsi-tsa-dat)(1)
    • 2005 ieee vlsi-tsa international symposium on vlsi design, automation and test, 2005. (vlsi-tsa-dat)., vlsi design, automation and test, 2005. (vlsi-tsa-dat). 2005 ieee vlsi-tsa international symposium on, vlsi design, automation & test(1)
    • 2008 ieee international test conference(1)
    • 2008 ieee international test conference, test conference, 2008. itc 2008. ieee international(1)
    • 2009 46th acm/ieee design automation conference, design automation conference, 2009. dac '09. 46th acm/ieee(1)
    • 2009 ieee international reliability physics symposium(1)
    • 2009 ieee international reliability physics symposium, reliability physics symposium, 2009 ieee international(1)
    • 2010 ieee international test conference (itc)(1)
    • 2010 ieee international test conference, test conference (itc), 2010 ieee international(1)
    • 2014 ieee 32nd vlsi test symposium (vts), vlsi test symposium (vts), 2014 ieee 32nd(1)
    • asp-dac 2004: asia & south pacific design automation conference 2004 (ieee cat. no.04ex753)(1)
    • asp-dac 2004: asia and south pacific design automation conference 2004 (ieee cat. no.04ex753), design automation conference, 2004. proceedings of the asp-dac 2004. asia and south pacific, design automation(1)
    • dac design automation conference 2012, design automation conference (dac), 2012 49th acm/edac/ieee(1)
    • ieee design & test of computers, design & test of computers, ieee, ieee des. test. comput.(1)
    • ieee transactions on computers, computers, ieee transactions on, ieee trans. comput.(1)
    • international test conference, 2003. proceedings itc 2003(1)
    • international test conference, 2003. proceedings. itc 2003., test conference, 2003. proceedings. itc 2003. international, international test conference(1)
    • proceedings 2004 ieee international workshop on current & defect based testing (ieee cat. no.04ex1004)(1)
    • proceedings of the 2002 ieee international workshop on memory technology, design & testing (mtdt2002)(1)
    • proceedings of the 2002 ieee international workshop on memory technology, design and testing (mtdt2002), memory technology, design and testing, 2002. (mtdt 2002). proceedings of the 2002 ieee international workshop on, memory technology design and testing(1)
    • proceedings of the eighth ieee international on-line testing workshop (ioltw 2002)(1)
    • proceedings of the eighth ieee international on-line testing workshop (ioltw 2002), on-line testing workshop, 2002. proceedings of the eighth ieee international, on-line testing workshop(1)
    • proceedings. 2004 ieee international workshop on current and defect based testing (ieee cat. no.04ex1004), current and defect based testing, 2004. dbt 2004. proceedings. 2004 ieee international workshop on, current and defect based testing(1)
    • records of the 2003 international workshop on memory technology, design & testing(1)
    • records of the 2003 international workshop on memory technology, design and testing, memory technology, design and testing, 2003. records of the 2003 international workshop on, memory technology, design and testing(1)
    • records of the 2004 international workshop on memory technology, design & testing(1)
    • records of the 2004 international workshop on memory technology, design and testing, 2004., memory technology, design and testing, 2004. records of the 2004 international workshop on, memory technology, design and testing(1)

  • 발행처
    • ieee(40)
    • acm(2)
    • american institute of physics(2)
    • association for computing machinery(2)
    • ieee computer society(1)
    • ieee press(1)

  • 언어
    • english(51)

  • 수록DB
    • IEEE Xplore Digital Library(24)
    • Complementary Index(23)
    • ACM Full-Text Collection(3)
    • Academic Search Complete(1)
    • Networked Digital Library of Theses & Dissertations(1)

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