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[키워드: "Wookje Kim"]

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  • Facet Limit
    • 원문(Full Text)
    • Peer-Reviewed 학술지
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    재검색

  • 자료유형
    • Conference Materials(9)
    • Academic Journals(3)

  • 주제어
    • components, circuits, devices and systems(3)
    • engineered materials, dielectrics and plasmas(3)
    • degradation(2)
    • doping(2)
    • random access memory(2)
    • silicon(2)
    • transistors(2)
    • cmos memory integrated circuits(1)
    • contacts(1)
    • dram chips(1)
    • electrodes(1)
    • electrostatic discharge(1)
    • epitaxial growth(1)
    • epitaxial layers(1)
    • fluctuations(1)
    • hot carriers(1)
    • image edge detection(1)
    • insulation(1)
    • integrated circuit reliability(1)
    • ion implantation(1)
    • leakage current(1)
    • logic gates(1)
    • mosfet circuits(1)
    • mosfets(1)
    • optimization(1)
    • photonics and electrooptics(1)
    • scalability(1)
    • semiconductor device doping(1)
    • strain(1)
    • stress(1)
    • substrates(1)
    • subthreshold current(1)

  • 저널
    • 한국진공학회 학술발표회초록집(4)
    • 2006 european solid-state device research conference(1)
    • 2006 european solid-state device research conference, solid-state device research conference, 2006. essderc 2006. proceeding of the 36th european(1)
    • 2007 ieee international electron devices meeting(1)
    • 2007 ieee international electron devices meeting, electron devices meeting, 2007. iedm 2007. ieee international(1)
    • 2010 international electron devices meeting, electron devices meeting (iedm), 2010 ieee international(1)
    • ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices(1)
    • journal of korean vacuum science & technology(1)
    • surface review and letters (srl)(1)

  • 발행처
    • ieee(5)
    • 한국진공학회(4)
    • world scientific publishing co. pte. ltd.(1)
    • 한국진공학회(asct)(1)

  • 언어
    • english(7)
    • korean(5)

  • 수록DB
    • DBPIA(5)
    • IEEE Xplore Digital Library(4)
    • Complementary Index(2)
    • RePEc(1)

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