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[키워드: "Wu, Kai-Chiang"]

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    • 원문(Full Text)
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  • 자료유형
    • Conference Materials(29)
    • Academic Journals(18)

  • 주제어
    • components, circuits, devices and systems(10)
    • reliability(9)
    • logic gates(8)
    • logic circuits(6)
    • computing and processing(5)
    • degradation(5)
    • delays(5)
    • clocks(4)
    • integrated circuit design(4)
    • runtime(4)
    • soft errors(4)
    • algorithm design and analysis(3)
    • algorithm research(3)
    • circuit faults(3)
    • clustering algorithms(3)
    • creep(3)
    • design(3)
    • detectors(3)
    • electronics(3)
    • integrated circuit modeling(3)
    • integrated circuits(3)
    • mathematical model(3)
    • monitoring(3)
    • optimization(3)
    • real-time clocks (computers)(3)
    • reliability in engineering(3)
    • resistance(3)
    • sensor placement(3)
    • switching circuits(3)
    • transistors(3)
    • attenuation(2)
    • circuits(2)
    • communication, networking and broadcast technologies(2)
    • delay(2)
    • error analysis(2)
    • fatigue(2)
    • finite element(2)
    • finite element analysis(2)
    • integer linear programming (ilp)(2)
    • leakage reduction(2)
    • negative-bias temperature instability (nbti)(2)
    • partitioning(2)
    • power module(2)
    • pvt variation(2)
    • redundancy(2)
    • robotics and control systems(2)
    • signal processing and analysis(2)
    • soft error rate (ser)(2)
    • soldering(2)
    • strain(2)

  • 저널
    • ieee transactions on computer-aided design of integrated circuits & systems(6)
    • ieee transactions on very large scale integration (vlsi) systems(6)
    • asia & south pacific design automation conference(3)
    • proceedings of the conference: design, automation & test in europe(3)
    • conference on design, automation & test in europe(2)
    • ieee transactions on computer-aided design of integrated circuits and systems(2)
    • 2008 ieee/acm international conference on computer-aided design, computer-aided design, 2008. iccad 2008. ieee/acm international conference on(1)
    • 2012 design, automation & test in europe conference & exhibition (date)(1)
    • 2014 9th international microsystems, packaging, assembly & circuits technology conference (impact)(1)
    • 2014 9th international microsystems, packaging, assembly and circuits technology conference (impact), microsystems, packaging, assembly and circuits technology conference (impact), 2014 9th international(1)
    • 2018 design, automation & test in europe conference & exhibition (date), design, automation & test in europe conference & exhibition (date), 2018(1)
    • 2019 electrical design of advanced packaging and systems (edaps), electrical design of advanced packaging and systems (edaps), 2019(1)
    • 2019 ieee 25th international symposium on on-line testing and robust system design (iolts), on-line testing and robust system design (iolts ), 2019 ieee 25th international symposium on(1)
    • 2019 ieee 37th vlsi test symposium (vts), vlsi test symposium (vts), 2019 ieee 37th(1)
    • 2019 ieee computer society annual symposium on vlsi (isvlsi), vlsi (isvlsi), 2019 ieee computer society annual symposium on(1)
    • 2019 ieee international test conference (itc), test conference (itc), 2019 ieee international(1)
    • 2020 ieee 38th vlsi test symposium (vts), vlsi test symposium (vts), 2020 ieee 38th(1)
    • 2020 international symposium on vlsi design, automation and test (vlsi-dat), vlsi design, automation and test (vlsi-dat), 2020 international symposium on(1)
    • acm transactions on design automation of electronic systems (todaes)(1)
    • asia & south pacific conference on design automation, 2006(1)
    • dac: annual acm/ieee design automation conference(1)
    • ieee transactions on control systems technology(1)
    • ieee transactions on device & materials reliability(1)
    • ieee transactions on device and materials reliability(1)
    • international conference on computer aided design(1)
    • international symposium on physical design(1)
    • proceedings of the 17th ieee/acm international symposium: low-power electronics & design(1)
    • proceedings of the 2008 asia & south pacific design automation conference(1)
    • proceedings of the 2008 ieee/acm international conference: computer-aided design(1)
    • proceedings of the conference: design, automation & test in europe (9783981080155)(1)
    • proceedings of the conference: design, automation & test in europe (9783981080162)(1)

  • 발행처
    • ieee(22)
    • association for computing machinery(17)
    • ieee-inst electrical electronics engineers inc(7)
    • edaa(1)

  • 언어
    • english(63)

  • 수록DB
    • Complementary Index(26)
    • USPTO Patent Grants(11)
    • IEEE Xplore Digital Library(10)
    • Science Citation Index(7)
    • USPTO Patent Applications(5)
    • Business Source Complete(2)
    • Academic Search Complete(2)
    • Networked Digital Library of Theses & Dissertations(1)

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